XRD patterns of ((Sr1−yBay)0.97Tb0.03)2SiO4 (y = 0.05, 0.15, 0.20) (a)
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Descrição
Solved The XRD patterns of fresh (A) and spent (B)
Excitation spectrum (λem = 544 nm) (a) and emission spectra
Solved Consider the following XRD pattern for Aluminum
Excitation spectrum (λem = 544 nm) (a) and emission spectra
a) XRD patterns of Sr1‐yBayY2O4:0.06Eu²⁺ (0 ≤ y ≤ 0.5). b
XRD patterns of ((Sr1−yBay)0.97Tb0.03)2SiO4 (y = 0.05, 0.15, 0.20
XRD patterns of standard card of Sr2SiO4 with PDF No.: 39-1256 and
XRD patterns of Pb 1−x Sr x [(Zr 0.52 Ti 0.48 ) 0.95 (Mn 1/3Nb 2
a), (b) Results of x-ray diffraction (XRD) measurement of samples
Preparation of single-phase YbB6 by low-temperature solid-state
XRD patterns Cr 0.03 Sn 0.97−y Ti y O 2 of samples with y = 0.270
a) XRD patterns of Sr1‐yBayY2O4:0.06Eu²⁺ (0 ≤ y ≤ 0.5). b
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